SPARC: Shortest Path and Antichain for Reliable Communication | Two New Metrics for Secure and Reliable Data Transmission

Tulane researchers have developed breakthrough error-correcting codes using novel mathematical distance measures built on poset structures. These methods enable systematic construction of optimal constant-weight perfect codes that completely partition data space without gaps, surpassing traditional Hamming metric limitations for high-reliability communication and storage applications.

SPARC: Shortest path and antichain

The Problem

Current error-correcting codes using standard Hamming metrics struggle to create optimal codes for applications requiring constant-weight codewords, such as optical storage and wireless communications. Traditional approaches that simply count coordinate differences fail to capture structured relationships between data positions, limiting their effectiveness in emerging high-reliability applications.

The Solution

This technology introduces two innovative distance measures—a shortest-path metric and an antichain metric—both built on mathematical poset structures. These metrics enable construction of constant-weight perfect linear codes whose error-correction capabilities partition data space without gaps or overlaps. The framework provides concrete methods for building previously unavailable perfect codes with mathematically proven distance properties and optimal performance bounds.

The Opportunity

The technology addresses critical needs in high-reliability data storage, satellite and optical fiber communications, and wireless networks operating in challenging interference environments. Applications span the global error correction code market, including cloud storage systems, 5G/6G telecommunications infrastructure, aerospace communications, and data centers requiring enhanced reliability. The methods offer superior performance for channels with correlated or structured data dependencies.

Meet the Team

Headshot portrait of John Scott.
John Scott
Technology Commercialization

Associate Director, Office of Intellectual Property Management
 

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Aileen Dingus

Aileen J. Dingus, MSE

Program Director

adingus1@tulane.edu